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Nanocomp

  1. 13/02/2009
    J. Suñé is co-author of new textbook published by Wiley-IEEE Press which presents a comprehensive treatment of all aspects of reliability wearout mechanisms A Reliability Wearout Mechanisms in …
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Our research field is the simulation, modeling, characerization and reliability of micro/nano electron devices. In particular, we focus on the study of emerging devices through a multi-scale approach which includes first-principle calculations, pseudo-empirical methods, Monte Carlo simulation of electron transport and compact modeling.

One of our main goals is to incorporate new students interested in research who would like to participate in our projects and work towards their Ph. Degree. We offer ourselves to jointly search funding sources for these interested students.

We also welcome new post-doc researchers willing to work in our research projects.

Universitat Autònoma de Barcelona NANOCOMP, Research Group of Computational Nanoelectronics